Detailed analysis of various types of perovskite solar cells with ToF-SIMS using different sputter sources
Jonas Hanisch a, Tina Wahl a, Moritz Schultes a, Erik Ahlswede a
a Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), Stuttgart, Meitnerstraße, 1, Stuttgart, Germany
International Conference on Hybrid and Organic Photovoltaics
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV18)
Benidorm, Spain, 2018 May 28th - 31st
Organizers: Emilio Palomares and Rene Janssen
Poster, Jonas Hanisch, 284
Publication date: 21st February 2018

The rise of the perovskite solar cells (PSC) within the last years has been accompanied with many different and novel absorber compositions and recipes with promising results for many of them. Furthermore, various cell architectures exist, including a variety of used substrates, electron and hole transporting layers. Nevertheless, there is still room for improvement regarding e.g. the performance and long-term stability or the hysteretic behaviour of several types of PSCs.

To achieve further progress and a more profound understanding of the PSCs, deeper analysis is needed. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) can be a powerful tool concerning the open questions. Besides the very good detection limit of some elements and molecules with ToF-SIMS, depth profiling delivers also valuable information about the distribution of the elements within the layer stack.

At ZSW we have the possibility to use four different sputter sources in our ToF-SIMS setup, which allows us to choose the optimal parameters regarding the questions to be dealt with. Especially the cluster sources (several hundred or more atoms in a cluster) enable the addressing of perovskite specific questions. With the argon cluster source e.g., the fragmentation of the molecules is minimal. Therefore, elements as well as compounds (as e.g. methyl ammonium) can be detected. In addition, the oxygen cluster source allows an improved measurement of the alkaline metals, which play an important role in recently developed recipes without driving them into deeper layers during depth profiling.

In this work we show ToF-SIMS depth profiles of inverted and standard cell architectures with different perovskite absorbers (e.g. lead acetate route or multiple cation recipes). ToF-SIMS reveals gradients of some of the absorber components in the depth profiles and can thereby help to explain the behavior of the complete solar cells and contribute to a better understanding of PSC.

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