X-ray Detection and Imaging Based on Lead-free Double Perovskites
Guangda Niu a, Bo Yang a, Weicheng Pan a, Haodi Wu a, Jiang Tang a
a Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan City, Hubei Province, China, 430074
nanoGe Fall Meeting
Proceedings of nanoGe Fall Meeting19 (NGFM19)
#RadDet19. Radiation Detection Semiconductors Materials, Physics and Devices
Berlin, Germany, 2019 November 3rd - 8th
Organizers: Mahshid Ahmadi and Germà Garcia-Belmonte
Invited Speaker, Guangda Niu, presentation 314
DOI: https://doi.org/10.29363/nanoge.ngfm.2019.314
Publication date: 16th July 2019

Due to the prominent advantages of defect tolerance, high carrier collection efficiency and large X-ray attenuation coefficient, metal halide perovskites have demonstrated excellent performance for direct radiation detection (X ray, gamma ray). However, the key bottleneck restricting its practical application lies in serious ion migration, excessive dark current, large area preparation and lead toxicity, etc. The development of lead-free halide perovskites and the realization of ion migration free and large area preparation have great research value. This report will focus on the latest progress of Cs2AgBiBr6 synthesis, device fabrication and imaging applications. The controlled cooling process, additive-mediated growth, and wafer preparation process will be discussed in detail. The heteroepitaxy passivation also effectively inhibit the ion migrations.

Fig. 1 X-ray imaging application from Cs2AgBiBr6 wafer.


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[2] B. Yang, W. Pan, H. Wu, G. Niu*, J. Yuan, K. Xue, L. Yin, X. Du, X. Miao, X. Yang, Q. Xie, J. Tang*, Nat. Communications 10, 1989 (2019).

[3] W. Yuan, G. Niu*, Y. Xian, H. Wu, H. Wang, H. Yin, P. Liu, W. Li, J. Fan, Advanced Functional Materials 1900234 (2019).

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