Extracting Defect Density from Capacitive Methods?
Germà Garcia-Belmonte a, Osbel Almora a, Marisé García-Batlle a
a Universitat Jaume I, Institute of Advanced Materials (INAM) - Spain, Avinguda de Vicent Sos Baynat, Castelló de la Plana, Spain
Poster, Germà Garcia-Belmonte, 010
Publication date: 1st April 2020
ePoster: View ePoster
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