Publication date: 17th July 2025
Nanocrystal-based devices consist of billions of particles, each different from the next.1 This intrinsic heterogeneity limits overall device performance – an issue that has been tolerated since the early studies on semiconductor nanocrystals, largely because existing analytical tools could not probe the properties of individual nanocrystals at scale. Here, we present a rapid, in-situ approach for determining the size and quantum yield (QY) of thousands of single nanocrystals within minutes, based on interferometric scattering microscopy2-4 and photoluminescence imaging. Tracking the entire lifecycle of CsPbBr₃ perovskite nanocubes - from their formation to their degradation - our method reveals key behaviors hidden in bulk measurements: an anticorrelation between size and QY in as-synthesized samples; preferential QY enhancement of smaller nanocubes during solution-phase defect engineering; and mitigation of material loss during light-induced degradation through capture of photoinduced electrons. This all-optical technique opens a new pathway for the rational synthesis and processing of solution-based nanocrystals for high-performance devices.
[1] J. Zhou et al., Nature 579, 41–50 (2020).
[2] K. Lindfors et al., Phys. Rev. Lett. 93, 037401 (2004).
[3] G. Young et al. Science 360, 423-427(2018).
[4] C. G. Gruber et al. Nature 630, 872–877 (2024).
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