Publication date: 23rd October 2020
In the literature, several protocols for different PSC technologies have already been published. However, due to the vastness and variety of materials in this class they are probably not applicable to all PSC devices and technologies due to two main reasons: 1) overlapping/superimposition of light soaking and degradation effects; 2) transient effect disturbing the device equilibrium.
A new protocol to measure perovskite photovoltaic devices (PSC) was developed and here presented. This protocol does not require prior information about the device and is universally applicable. It is particularly suitable to measure record devices as often there is no prior information on their behavior. The potential degradation under illumination is minimized, by measuring the most important parameter namely maximum power first and only afterwards determine the other I-V curve parameters.
The protocol proposed in this study consists of the following steps:
1) Perform initial quick automatic I-V scan in forward (from Isc to Voc) and reverse (from Voc to Isc) sweep direction. Typical sweep time 15 s with 100 data points.
2) Stabilize the device under light at fixed voltage near Vmp: monitor output power (which typically improves with time with typical time scales of several minutes)
3) Decrease the voltage stepwise until short-circuit conditions, that is 0 V (or slightly negative, but no more than 0.2 % of Voc).
4) Return to Vmp and check that output power of step 2 is reached
5) Increase the voltage stepwise until open-circuit conditions, that is Voc (or slightly higher, but reverse current should not exceed 2 % of Isc). At each step observe the output power and wait for its stabilization over time (typically within 0.2 %).
6) Return to Vmp and check that output power of step 2 and step 4 is reached
A number of devices was tested with the protocol above and results will be presented. Different PSC devices showed different behaviors. A discussion on the critical steps and how to act in the various occasions will be given.
This protocol will lead to reliable determination of PSC device performance, which also is representative of their real world performance in a PV installation. The latter might not be achieved by more traditional I-V curves determined from voltage sweeps, where the device is inherently never under steady-state conditions.
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