Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Publication date: 1st March 2014
Recent progress in using hybrid organic-inorganic perovskites as thin-film solar cell absorber materials has demonstrated their potential as cheap, high-efficiency alternatives to silicon-wafer-based photovoltaics. In the few years since their introduction into solar cell devices, power conversion efficiencies up to 15% have been demonstrated1. For solar cell applications, mixed methyl ammonium organometallic halide perovskites, CH3NH3XY3 (X = Pb or Sn and Y = I, Br, and/or Cl), are predominantly used, in particular CH3NH3PbI3-xClx. To date, the fundamental properties of these materials remain poorly understood. We have used a variety of X-ray and electron spectroscopies to study the chemical and electronic structures of these materials with varying information depths. Lab-based X-ray and ultra-violet photoelectron spectroscopies (XPS and UPS) have been used to investigate the surface core and valence levels of CH3NH3PbI3-xClx supported on a compact TiO2 layer. Synchrotron-based hard X-ray photoelectron spectroscopy, which has a larger information depth than lab-based XPS and UPS, has been used to investigate the near-surface region of the perovskite layer. Resonant and non-resonant soft X-ray emission spectroscopy provides additional information about occupied and unoccupied valence states in the near-surface bulk region of these materials. With this combination of spectroscopic methods, we will present a “depth-resolved” correlation between the chemical composition and electronic structure of CH3NH3PbI3-xClx thin films.
References:
1J. Burschka et al., Nature 499, 316 (2013)