Correlating the Chemical and Electronic Structure of the Surface and Near-surface Region of CH3NH3PbI(3-x)Clx Perovskite Solar Cell Absorbers
Regan G. Wilks a, Evelyn Handick a, David E. Starr a, Marcus Bär a c h, Henry Snaith b, Golnaz Sadoughi b, Monika Blum c, Lothar Weinhardt c e g, Clemens Heske c e g, Frank Meyer d, Andreas Benkert d e, Wanli Yang f
a Department of Physics, University of Oxford, Clarendon Laboratory, Parks Road, Oxford OX1 3PU, United Kingdom
b Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154-4003
c Experimentelle Physik 7, Universität Würzburg, D-97074 Würzburg, Germany
d Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, D-76344 Eggenstein-Leopoldshafen, Germany
e Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA, United States
f ANKA Synchrotron Radiation Facility, Karlsruhe Institute of Technology, D-76344 Eggenstein-Leopoldshafen, Germany
g Institut für Physik und Chemie, Brandenburgische Technische Universität Cottbus-Senftenberg, D-03046 Cottbus, Germany
International Conference on Hybrid and Organic Photovoltaics
Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Ecublens, Switzerland, 2014 May 11th - 14th
Organizers: Michael Graetzel and Mohammad Nazeeruddin
Poster, Evelyn Handick, 083
Publication date: 1st March 2014

Recent progress in using hybrid organic-inorganic perovskites as thin-film solar cell absorber materials has demonstrated their potential as cheap, high-efficiency alternatives to silicon-wafer-based photovoltaics. In the few years since their introduction into solar cell devices, power conversion efficiencies up to 15% have been demonstrated1. For solar cell applications, mixed methyl ammonium organometallic halide perovskites, CH3NH3XY3 (X = Pb or Sn and Y = I, Br, and/or Cl), are predominantly used, in particular CH3NH3PbI3-xClx. To date, the fundamental properties of these materials remain poorly understood. We have used a variety of X-ray and electron spectroscopies to study the chemical and electronic structures of these materials with varying information depths. Lab-based X-ray and ultra-violet photoelectron spectroscopies (XPS and UPS) have been used to investigate the surface core and valence levels of CH3NH3PbI3-xClx supported on a compact TiO2 layer. Synchrotron-based hard X-ray photoelectron spectroscopy, which has a larger information depth than lab-based XPS and UPS, has been used to investigate the near-surface region of the perovskite layer. Resonant and non-resonant soft X-ray emission spectroscopy provides additional information about occupied and unoccupied valence states in the near-surface bulk region of these materials. With this combination of spectroscopic methods, we will present a “depth-resolved” correlation between the chemical composition and electronic structure of CH3NH3PbI3-xClx thin films.

 

References:

1J. Burschka et al., Nature 499, 316 (2013)



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