Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Publication date: 1st March 2014
The single diode model is often used to describe the current-voltage response of a solar cell and hence facilitates prediction of its cell performance and ultimately, efficiency. To simulate this curve, five input parameters must be evaluated and understood. In combination with a mathematical understanding of how the parameters change with arbitrary lateral dimensions, this allows for accurate replication of solar cell performance and hence guides device scale-up and the design of photovoltaic modules.
For simplicity, the series resistance parameter is typically treated as fixed for a given device. We have evaluated the applicability of this simplification using a literature method which allows for the evaluation of series resistance as a function of voltage. The results of the experiment illustrated that Rs is not constant with voltage for either OPV or DSC architectures. This result is important as it impacts prediction of the position of the maximum power point in a current-voltage curve, and hence the overall device efficiency.
‘Champion cell’ efficiencies are often derived from measurements of a very small cell – typically one square centimetre or smaller. More often than is reported, the design of the test cell as well as the method used in the measurement can vary significantly. Hence, comparing the efficiency of one type of cell architecture to another cell therefore becomes difficult if not impossible. Edge‑effects on device short‑circuit current density (jsc) are prominent in test cell conditions due to the large edge:area ratio. Fabrication of larger cells, which have a more favourable edge:area ratio is cumbersome, and prone to other experimental limits such as inhomogeneous film deposition resulting in structural defects. Through application of a procedure that utilises multiple dimension masks, we have been able to minimise the apparent effect, allowing estimate of an ‘edge-free jsc’ and hence improve reliability of one of the input parameters in our diode model.
Through our observations during fabrication of a variety of hybrid organic PV devices – OPV, DSC, ssDSC and most recently solid-state Perovskite Solar Cells (ssPSC) – we have attempted to analyse factors that affect efficiency measurements of these photovoltaic solar cells. We discuss in particular the design of the test cell, and how different mask designs effect the overall measurement. The reason for this is analysed, and a method to eliminate unnecessary edge effects is proposed for application to the meso-superstructured architectures of the solid-state Perovskite Solar Cells (ssPSC).
The importance of masking for solar cell evaluation. Excess light may enter through internal glass reflections (left). For masked areas, this is prevented, but non-collimated light may incident otherwise masked areas (right).
Fong, K. C.; McIntosh, K. R.; Blakers, A. W., "Accurate series resistance measurement of solar cells", Progress in Photovoltaics: Research and Applications 2013, 21, 490
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