Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Publication date: 1st March 2014
The environmental stability and lifetime of photovoltaic devices is a prime concern, particularly in the research of novel photovoltaic technologies. Organic, hybrid and Perovskite-based photovoltaic devices have all previously exhibited poor stability in oxygen rich and humid environments, with significant reduction in power conversion efficiencies observed, particularly when combined with light exposure. The National Physical Laboratory has a state-of-the-art experimental stability testing rig which can control the H2O and O2 content within a sample chamber to the part-per-million level in an arrangement that allows the continuous electronic or spectroscopic investigation of device properties. In addition, the exposure to illumination and temperature can also be controlled, allowing the study of the degradation of solar cells in detail and under highly controlled conditions. The precision H2O and O2 controls present many advantages, such as allowing the comparison of device degradation under pure-N2 conditions, as well as conditions similar to those within an encapsulated device, ambient conditions and everything in between.
The latest experimental results on the stability of polymer:fullerene photovoltaic devices in this novel environmental testing system will be presented. In OPV devices, interlayers between the active material and electrodes have previously been shown to degrade faster than the photovoltaic material itself, particularly the commonly used material poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) (PEDOT:PSS). Here we present the results of a systematic study of devices with various interlayers, with the aim of isolating and identifying degradation of specific interlayer materials in both encapsulated and ambient conditions. This includes time-dependent electrical, optical and chemical measurements of OPV devices throughout the degradation process to identify the main modes of failure.