Characterization of photovoltaic and photochemical devices using combinedmodulated methods
Agustin O. Alvarez a, Elena Mas Marzà a, Miguel Garcia-Tecedor a, Sixto Gimenez-Julia a, Francisco Fabregat-Santiago a
a Institute of Advanced Materials (INAM), Universitat Jaume I, 12071 Castelló de la Plana, Spain
International Conference on Hybrid and Organic Photovoltaics
Proceedings of 13th Conference on Hybrid and Organic Photovoltaics (HOPV21)
Online, Spain, 2021 May 24th - 28th
Organizers: Marina Freitag, Feng Gao and Sam Stranks
Oral, Francisco Fabregat-Santiago, presentation 114
Publication date: 11th May 2021

The characterization of the operating mechanisms of photosensitive devices is essential for their improvement. Impedance spectroscopy (IS) has been thoroughly used for that purpose. The analysis of the IS response is generally done through the modeling of the internal processes into an equivalent circuit (EC), whose selection is usually difficult given that many circuits can give the same response. The analysis of intensity-modulated photocurrent (IMPS) and photovoltage (IMVS) spectroscopies have also proven to be useful in optoelectronic characterization, generally through their time constants. Here a procedure is established for the direct analysis of IMPS and IMVS spectra with an EC[A1] [A2] . It is exhibited how this procedure allows accurate identification of the appropriate EC. Using that analysis, it is shown that the three spectra, obtained by measuring the techniques for a silicon photodiode, are reproduced with the same EC. As a result, parameters inaccessible from IS are obtained, such as the separation efficiency, external and internal quantum efficiency. The application of these results on other photosensitive devices will allow for more accurate identification and quantification of their operational mechanisms.

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