In-situ monitoring of perovskite formation during spin-coating and evaporation processes
Christian Camus a
a LayTec AG, Seesener Straße, 10-13, Berlin, Germany
International Conference on Hybrid and Organic Photovoltaics
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV22)
València, Spain, 2022 May 19th - 25th
Organizers: Pablo Docampo, Eva Unger and Elizabeth Gibson
Oral, Christian Camus, presentation 296
Publication date: 20th April 2022

In this industrial talk we present LayTec's InspiRe metrology system for in-situ monitoring perovskite formation processes. This systems allows to monitor the formation in real-time by means of spectral reflectance measurements. The mothodology can be applied for obtaining spectral "fingerprints" during wet-chemical processes such as spin-coating or slot-die-coating as well as during physical vapor deposition. In this talk, we also show first examples of real time growth rate and film thickness monitoring applied during perovskite evaporation. Here, growth rate and thickness values are obtained by fitting the reflactance signal based on optical models. Finally, we will give an outlook on complementary metrology methods like spectral and time-resolved photoluminescence.

We gratefully acknowledge our cooperation partners at HySprint / HZB (groups of E. Unger and S. Albrecht)

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