Towards Characterization of Perovskite Crystals under Solar Cell Operating Conditions: SEM-EBSD Measurement Parameters and Protective Coatings
Lars Sonneveld a, Nikolai Orlov a, Eric Garnett a, Bruno Ehrler a
a AMOLF, Science Park, 102, Amsterdam, Netherlands
Poster, Lars Sonneveld, 218
Publication date: 6th February 2024

Hybrid organic-inorganic perovskite solar cells have tremendous potential for scaling up the solar industry. The high tolerance to defects of perovskite materials allows for cheap manufacturing to make high efficiency solar cells. However, the commercialization of perovskite solar cells is being held back by stability issues under light irradiation and electrical current.

To understand the degradation of perovskite solar cells we use electron backscatter diffraction (EBSD) to study the changes of the crystal structure. EBSD is a scanning electron microscope (SEM) technique that resolves the crystal structure and crystal grain orientations with high spatial resolution. Recently, studying organic-inorganic perovskite materials with EBSD has become possible due to the development of a highly sensitive direct detection EBSD system, allowing very low e-beam currents. However, perovskite materials still suffer from damage due to the e-beam and high vacuum environment in the SEM.

Here we present a systematic investigation on the degradation of perovskite materials in the SEM for EBSD measurements. We investigated coatings and optimized system parameters for measuring perovskites. We study damage of the e-beam separately from damage and degradation by the vacuum environment.

With these optimized measurement parameters and protective coatings, we enable the measurement of perovskite materials under real operating conditions: application of light and voltage bias.

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