Publication date: 17th February 2025
Perovskite solar cells (PSCs) have emerged as a promising photovoltaic technology, yet their commercialization is hindered by surface defects that promote non-radiative recombination and reduce stability. One strategy to minimize recombination losses is by passivating the perovskite layer. This study uses photoemission electron microscopy (PEEM) which is a highly surface-sensitive technique to explore the effects of ethylenediamine diiodide (EDAI) passivation on defects in triple cation mixed halide perovskite films. PEEM uses the shallow penetration depth of UV photons of only a few nanometers in perovskites to probe the topmost layers where defects are prevalent. We used 270 nm (4.59 eV) photons to image midgap defect states. Next we used 210 nm (5.90 eV) photons to get detailed electronic spectrum from these defects with high spatial resolution. The PEEM images demonstrate a significant reduction in photoemission intensity from defects in EDAI-passivated samples compared to unpassivated control sample, suggesting effective suppression of midgap trap states. Energy-resolved photoelectron spectroscopy (PES) supports this finding which shows suppressed signal from midgap defects in passivated perovskite sample while the valence band edge spectrum remains unchanged. This consistency supports that signal attenuation is due to passivation layer confirming genuine passivation by EDAI. Spatially resolved PEEM maps highlight uniform defect suppression across the film. This highlights EDAI’s potential for scalable, large-area PSC production.
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