Publication date: 11th March 2026
Understanding processes that contribute to efficiency losses during long-term operation of perovskite solar cells is crucial for achieving operational stability. For example, photoinduced migration of halide ions and cations is known to significantly affect the device performance [1]. Under open circuit conditions, however, no current flow is allowed, therefore charge carrier recombination and charge carrier accumulation at the interfaces remain as dominating processes. Because of the possibility of charge accumulation, PSCs are susceptible to chemical transformations and undergo degradation under open circuit conditions than under MPP tracking conditions. The thermodynamic and redox properties of halide perovskites provide a strong driving force for hole trapping and oxidation of iodide species under photoirradiation.
In the case MAPbI3/spiro-OMeTAD, hole accumulation leads to formation of I2 and subsequent oxidation of spiro-OMeTAD. By employing in-situ absorption measurements we show that the decrease in power conversion efficiency follows the spiro-OMeTAD oxidation by I2 while operating the solar cell device under open circuit conditions [2]. In short circuit conditions, where photogenerated charge carriers are extracted in the external circuit, the iodide induced oxidation of spiro-OMeTAD and the device instability are greatly minimized. Incorporation of Cs+ as A-site cation also suppresses iodine expulsion. The photoinduced iodine migration in MAPbI3 followed by its expulsion into spiro-OMeTAD that provides new insight into the photoinstability of perovskite solar cells will be presented.
The work is supported by the Division of Materials Sciences and Engineering Office of Basic Energy Sciences of the U.S. Department of Energy through Award DE-SC0014334
