Simultaneous Time-Resolved Photoluminescence and Quantum Yield Measurement Using Random Fluctuating Light
Jiří Junek a, Robert Hlaváč b, Aleš Vlk b, Karolína Křížová b, Karel Židek a, Martin Ledinský b
a Institute of Plasma Physics of the Czech Academy of Sciences, U Slovanky 2525/1a, 182 00 Praha 8, Czech Republic
b Institute of Physics of the Czech Academy of Sciences
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV26)
Uppsala, Sweden, 2026 May 18th - 20th
Organizers: Gerrit Boschloo, Ellen Moons, Feng Gao and Anders Hagfeldt
Poster, Robert Hlaváč, 245
Publication date: 11th March 2026

For the characterization of solar cell passivation and recombination processes at defect states, it is essential to employ time-resolved photoluminescence (TRPL) and photoluminescence quantum yield (PLQY). 
Standard TRPL presents two key limitations: the high peak intensity of the laser pulses (often reaching GW/cm²) and the long acquisition times. Since metal halide perovskites (MHPs) are intended for photovoltaic applications, the use of high-intensity, short laser pulses does not accurately replicate real-world solar irradiation conditions. Moreover, the "soft" nature of MHPs means such high peak intensities may alter the sample itself, potentially compromising the relevance of the results.
To address these challenges, we employ RATS (Random Temporal Signals) [1,2], a method that measures PL lifetime under quasi continuum  excitation conditions closely approximating the continuous solar irradiation in comparison with traditional pulsed laser excitation. We were able to directly combine the RATS  with simultaneous measurement of PLQY, enabling the evaluation of radiative and non-radiative recombination rates in the studied material. 
The method employs a randomly fluctuating light intensity, fluctuating between 0% and 200 % intensity of a one-sun illumination, averaging to one-sun intensity (adjustable for intensity-dependent studies), to excite the sample.  The PL response of  the sample is given by the convolution of the excitation profile and the PL decay. The fluctuating random excitation provides a broad range of frequencies in Fourier space, allowing the decay to be calculated from a single dataset in a second.
This approach offers a rapid, accurate, and non-destructive method for characterizing MHPs under realistic operating conditions, advancing both fundamental research and practical applications in photovoltaics.
 

© FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
We use our own and third party cookies for analysing and measuring usage of our website to improve our services. If you continue browsing, we consider accepting its use. You can check our Cookies Policy in which you will also find how to configure your web browser for the use of cookies. More info