The Diagnostic Bridge: Evaluating Laminated OPV Performance via High-Fidelity Spectral Simulation
Ümran Işıl Biçer a b
a infinityPV APS, Møllehaven, 12A, Jyllinge, Denmark
b Technical University (TU) Dresden, Mommsenstr. 13, Dresden, 1062, Germany
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV26)
Uppsala, Sweden, 2026 May 18th - 20th
Organizers: Gerrit Boschloo, Ellen Moons, Feng Gao and Anders Hagfeldt
Poster, Ümran Işıl Biçer, 250
Publication date: 11th March 2026

Bridging the gap between laboratory-scale optimal conditions and industrial Roll-to-Roll (R2R) production remains a fundamental challenge for the commercialization of organic photovoltaics (OPV). Developed within the framework of the Horizon Europe EIFFEL Doctoral Network, this research introduces a "Diagnostic Bridge" designed to translate academic material innovations into industrially viable devices. Laminated architectures offer a highly scalable and deconstructable pathway for continuous device fabrication; however, they frequently exhibit a significant performance deficit when compared to standard spin-coated cells. This study investigates the optoelectronic and mechanical limits of laminated OPVs utilizing the Flextrode architecture, comprising positive and negative sub-stacks.

To accurately quantify efficiency losses during the transition to industrial scaling, precision metrology is strictly required. We establish a comprehensive characterization methodology that couples custom algorithm-driven spectral irradiance calibration with macroscopic device analysis. High-fidelity measurements are achieved using a dynamically tunable, multi-channel LED solar simulator (ISOSunPro) calibrated to IEC 60904-9:2020 AM1.5G standards. A dual-sensor feedback algorithm processes empirical spectrometer interpolation and integrated photodiode power density to ensure precise spatial and spectral uniformity. This algorithmic approach specifically mitigates spectral mismatch errors inherent to narrow-band active materials, including both PCBM- and NFA-based devices.

By pairing this standardized metrology with variable thermal and pressure lamination parameters, we systematically isolate the origins of performance degradation. The study presents critical thickness-to-pressure thresholds, defining the mechanical survival limits of thin (150 nm) versus thick (500 nm) active layers. Additionally, directional illumination analysis and continuous IV evaluations elucidate the impact of mechanical stress on charge extraction boundaries and shunt resistance. Ultimately, this work establishes a diagnostic infrastructure for the EIFFEL network, enabling "post-mortem" interface analysis to optimize network-wide materials for the realities of ambient, industrial-scale production.

This project has received funding from the Horizon Europe Framework Programme under the Marie Skłodowska-Curie Doctoral Networks Grant Agreement - GA-101119780.
Project duration: 01.02.2024 – 31.01.2028. The author would like to thank supervisors Frederik C. Krebs (infinityPV) and Prof. Yana Vaynzof (TU Dresden) for their guidance and support in bridging industrial and academic methodologies. Special thanks are also extended to the EIFFEL Doctoral Network and collaborators.

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