IEC Standardization Activity on Emerging PV Device Measurement (OPV, DSC and PSC)
Toshiro Matsuyama a, Christopher Fell b, Giorgio Bardizza c
a RATO (Research Association for Technology Innovation of Organic Photovoltaics ), Japan
b CSIRO Energy Centre, Australia
c European Commission, DG JRC – Directorate C Energy,Transport and Climate - Energy Efficiency and Renewables Unit - European Solar Test Installation
Asia-Pacific International Conference on Perovskite, Organic Photovoltaics and Optoelectronics
Proceedings of International Conference on Perovskite and Organic Photovoltaics and Optoelectronics (IPEROP19)
Kyōto-shi, Japan, 2019 January 27th - 29th
Organizers: Hideo Ohkita, Atsushi Wakamiya and Mohammad Nazeeruddin
Oral, Toshiro Matsuyama, presentation 033
Publication date: 23rd October 2018

In May 2016, IEC (International Electrotechnical Commission ) TC82(Photovoltaic ) launched TR project on performance measurement protocol of emerging PV (OPV, DSC and PSC), closed the discussion in September 2018 and will publish TR document shortly. This TR(Technical Report) project is intended to bring relevant information of currently available standards and recent technologies in order to start formal discussion toward world standard. The team members consist of 30 scientists from 13 countries.

The discussion is limited to performance measurement only and it does not include anything about long time durability.  Both basic performance measurement and measurement method for applications such as indoor and tandem, are discussed, but main focus remains on basic performance measurement. In order to address the new materials to which currently available standards cannot cover rightly, it is recommended, in TR, to introduce new definitions on steady state condition and stabilized state.

Exact description of the definition is carefully avoided in TR, because it should be made in formal standardization process.  It is expected to have good start toward world standard based on the discussion and recommendation in this TR, with variety of people’s involvement.   In order to have good standard, it is crucial for both material/device scientists and metrology experts to sit and discuss together.


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