Analysis of the time response of perovskite solar cells toward more reliable spectral responsivity and I-V measurements
Giorgio Bardizza a, Diego Pavanello a, Harald Müllejans a
a European Commission, Joint Research Centre (JRC), Via Enrico Fermi, 2749, Ispra (Va), Italy
Asia-Pacific International Conference on Perovskite, Organic Photovoltaics and Optoelectronics
Proceedings of International Conference on Perovskite and Organic Photovoltaics and Optoelectronics (IPEROP19)
Kyōto-shi, Japan, 2019 January 27th - 29th
Organizers: Hideo Ohkita, Atsushi Wakamiya and Mohammad Nazeeruddin
Poster, Giorgio Bardizza, 125
Publication date: 23rd October 2018

The rapid development of perovskite solar cells performances and the related growing interest in this emerging PV technology [1] clearly indicate the need for methods and procedures to reliably measure and characterize PV devices known to possess a slow response time. Electrical power measurements under standard testing conditions (STC), as defined in the IEC-60904 series of standards can only be accurately made if sufficient time is allowed to complete photocurrent generation and efficient extraction of charges. This time is usually much longer for dye-sensitized and perovskite devices than for typical crystalline silicon [2]. Increasing the sweep time it may result in different effects which can influence and affect the device calibration. The accurate analysis of the dynamic response of these new devices is then fundamental toward more reliable measurements [3, 4, 5].

In this work we present an overview of the different effects happening during a calibration of a perovskite solar cells focusing in particular our attention to the analysis of their electrical response to a chopped light stimulus. The evaluation of the time response of two different perovskite devices (one single cell and one mini-module) showed a fast response up to a chopping frequency of about 80 Hz when the cell is kept close to short circuit condition. This allowed for spectral responsivity AC measurements at high chopping frequency (around 65 Hz). Current and voltage signals were acquired during the I-V sweeps in parallel to our acquisition system. The most appropriate I-V sweep parameters were selected and the effects of light soaking (periodical I-V measurements with the device kept under continuous illumination) and recovery in the dark (periodical I-V measurements with the device kept in the dark after a light soaking step) have been studied. Their contributions in the calibration process have been finally evaluated and solutions on how to better control them in order to improve the quality of the results are proposed, in order to ensure more reliable power measurements of perovskite devices and contribute to the development of new measurement protocols for this technology.

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