Exploration of Degradation in Perovskite Solar Cells via Thermal Hysteresis of Photocurrent and Capacitance
DHRUBA KHADKA a, Masatoshi YANAGIDA a, Yasuhiro SHIRAI a
a Photovoltaic Materials Group, Center for GREEN Research on Energy and Environmental Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
Proceedings of Asia-Pacific Conference on Perovskite, Organic Photovoltaics&Optoelectronics (IPEROP25)
Kyoto, Japan, 2025 January 19th - 21st
Organizers: Atsushi Wakamiya and Hideo Ohkita
Poster, DHRUBA KHADKA, 064
Publication date: 4th October 2024

Understanding the degradation mechanisms in perovskite solar cells (PSCs) is critical to addressing their stability challenges and ensuring their reliability for long-term applications.[1,2] Among the various performance issues, photocurrent loss is a prominent indicator of degradation in PSCs, directly impacting their efficiency and operational lifespan.[3,4] This study investigates the underlying processes contributing to degradation, focusing on the thermal hysteresis of photocurrent (THPC) and capacitance characteristics.[5]

THPC in degraded devices reveals a significantly higher variation in photogenerated current compared to pristine devices. Capacitance analysis supports the role of interfacial ionic charges and active defects in the degradation process.[6,7] Degraded devices exhibit increased capacitance, which corresponds to the presence of localized ionic charges and defects at critical interfaces. These ionic charges create localized electric fields, which intensify recombination losses and hinder efficient charge transport within the device.[8] The interplay of these effects exacerbates the degradation of PSCs under operational conditions. The simulations confirm that these interfacial defects are particularly detrimental in the presence of thermally activated ionic processes, which amplify their negative effects under prolonged thermal and photonic exposure. This study highlights the strong connection between PSC degradation and the presence of thermally activated traps and interfacial charge accumulation, emphasizing the critical need to passivate these pathways to enhance device stability.

This work is partly supported by the Kurata Memorial Hitachi Science and Technology Foundation (Kurata#1572 ).

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