Interface Engineering for Highly Durable Perovskite Solar Cells
Tsutomu Miyasaka a
a Toin University of Yokohama, Peccell Technologies, Inc.
Keynote, Tsutomu Miyasaka, presentation 014
Publication date: 22nd October 2026

The efficiency and stability of halide perovskite solar cells (PSCs) are sensitively altered by the chemical modification of junction interfaces. MXene, as a physically robust and conductive nanosheet, can replace organic charge transport materials. MXene modifying the surface of NiOx layer serves as an inorganic and thermally stable hole transport layer (HTL). A p-i-n type PSC composed of ITO/NiOx/MXene/SAM/Cs0.05MA0.15FA0.8PbI3/C60/BCP/Ag achieves power conversion efficiency 26.2% (certified) showing high operational stability at 85℃ and under 1 SUN light exposure (unencapsulated, >2000 h)[1]. As an extension of this study, boron-intercalated MXene was prepared as a standalone hole-selective layer, free from combination with NiOx. This MXene-based PSCs also shows durable stability under exposure to high humidity (60% RH) showing 90% retention for 2100 h [2]. Moisture-resistant PSCs can also be designed by using dopant-free hydrophobic organic HTL. Our n-i-p type device with a unique doner-accepter triazine derivative as dopant-free HTL shows operational stability over 2500 h in ambient air [3]. SAMs acting as interfacial modifiers form charge-selective junction interfaces without the use of electron transport layer (ETL) and HTL. A device in which interfaces of perovskite absorber are fully functionalized with SAMs [4] exhibited high durability, free from degradation caused by transport materials. Research progresses on improving device durability through interfacial molecular engineering will be introduced.

References
1. X. Wang, T. Miyasaka, X.-F. Wang, et al. Adv. Mat. 2026, 38, e73656.
2. Z. Liu, Y. Song, Q. Zhao, L. Yang, N. Shibayama, A. Ishii, X. Wang, S. Dua, X. F. Wang, T. Miyasaka, submitted.
3. B. H. Lee, G. Kim, T. Miyasaka, S. Y. Oh, et al. Adv. Energy Sustainability Res. 2025, 6, 2400299.
4. Z. Hu, N. Saito, M. Ikegami, N. Shibayama, and T. Miyasaka, Chem. Sci. 2026, 17, 5869

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