In-situ & in-line monitoring of perovskite processes
Madeleine Justianto a
a LayTec AG, Seesener Straße, 10-13, Berlin, Germany
Industry, Madeleine Justianto, presentation 015
Publication date: 22nd October 2026

LayTec Commercial Presentation at IPEROP 2027

The transition of perovskite photovoltaics from laboratory-scale development to industrial manufacturing requires robust process monitoring solutions that provide direct insight into film formation and enable rapid process feedback. Optical metrology offers a non-destructive approach to track critical material properties during deposition and processing.

In this contribution, we present process-integrated metrology solutions for monitoring perovskite thin films using spectral reflectance and photoluminescence (PL). These techniques provide access to key parameters such as film thickness, growth rate, optical properties, band gap and compositional changes. They can be applied across different perovskite fabrication routes, including spin coating, VCD, annealing, thermal evaporation and slot-die coating.

Reflectance measurements further reveal characteristic signatures of wet- and solid-film formation, reaction kinetics, roughness evolution and phase transitions. Beyond laboratory-scale in-situ monitoring, the same optical principles can be transferred to in-line production environments. In-line reflectance enables immediate thickness feedback during perovskite evaporation, while PL-based approaches offer opportunities for band-gap and composition control. This presentation will highlight how integrated optical metrology can support faster process optimization, improved reproducibility and the scale-up of perovskite photovoltaic manufacturing.

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