Development of Li, Na, k-DOPED ZnO aS TCO by Spray Pyrolysis
Jaime González Cuadra a, Samuel Porcar a, Gina Soracá b, Diego Fraga Chiva a, Juan Bautista Carda a, Teodora Stoyanova a
a Universitat Jaume I, Department of Inorganic and Organic Chemistry, Spain, Avinguda de Vicent Sos Baynat, Castelló de la Plana, Spain
b Universidad Pedagogia y tecnologia de Colombia, Avenida Central del Norte 39-115, 150003 Tunja, Boyacá, Colombia, Bogotá, Colombia
Poster, Jaime González Cuadra, 010
Publication date: 30th May 2020
ePoster: 

This paper studies a development of Li, Na, K-doped ZnO prepared by easy low-cost spray pyrolysis method for photovoltaic thin film solar cells. We report structural, optical, and electrical properties of undoped and doped Zn1-x MxO (x=0.03) solid solutions. The resulting coatings crystallize in a single hexagonal phase of wurtzite structure with preferred c-axis orientation along (002) crystal plane. Dense, well attached to the substrate, homogeneous and highly transparent layers were obtained with optimal optical transmittance of 82% corresponding to Li doped ZnO sample. The optical energy band gap of doped ZnO films increase from 3.27 to 3.29 eV by doping with Li, Na and K, respectively. The electrical resistivity varying from 3.18 to 5.64 × 10-2 Ω.cm, while the mobility and the carrier concentrations increased from 14.6 to 161.7 cm2/V.s and from 1.11 × 1018 to 8.49 × 1018 cm-3, respectively. Very low resistive thin films, bellow 0.05 (Ω·cm), with n-type conductivity were developed as excellent transparent conductive oxide (TCO) for solar cell applications.

The authors would like to acknowledge the financial support of the Spanish Ministry of Economy and Competitiveness under the program Programa Estatal de I+D+i orientada a los retos de la sociedad (ENE2017-87671-C3-3-R). We also appreciate the characterization assistance of Central Service of Scientific Instrumentation (SCIC) at the University Jaume I. We also thank the group of Prof. A. Perez (IREC) and the group of Prof. J. Bisquert (INAM-UJI) for the analysis and characterisation assistance.

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