Impedance Spectroscopy as a non-destructive technique for Organic Solar Cell characterization
Beatriz Romero a, Belén Arredondo a, Diego Martín-Martín a, Gonzalo del Pozo a, Vida Engmann b, Morten Madsen b
a Escuela Superior de Ciencias Experimentales y Tecnología, Universidad Rey Juan Carlos, C/ Tulipán s/n, 28933, Móstoles, Madrid
b SDU NanoSYD, Mads Clausen Institute, University of Southern Denmark, Alsion2, 6400 Sonderborg, Denmark
Materials for Sustainable Development Conference (MATSUS)
Proceedings of MATSUS23 & Sustainable Technology Forum València (STECH23) (MATSUS23)
#NewOPV - New concepts for stable non-fullerene based organic solar cells and their applications
VALÈNCIA, Spain, 2023 March 6th - 10th
Organizers: Vida Engmann, Morten Madsen and Pavel Troshin
Invited Speaker, Beatriz Romero, presentation 375
DOI: https://doi.org/10.29363/nanoge.matsus.2023.375
Publication date: 22nd December 2022

Impedance Spectroscopy (IS) is a non-destructive characterization technique that has been traditionally applied to inorganic optoelectronic devices, such as standard diodes, LEDs, LASERs and Solar Cells. This technique consists in applying a small sinusoidal voltage superimposed on a bias voltage and measuring the current response. This technique allows to distinguish between the different dynamical mechanisms occurring inside the device at different time scales, from ms to s, such as carrier recombination, carrier diffusion and/or ionic related phenomena. In our research group, we use this technique as a complementary tool to identify the main physical mechanisms responsible of organic solar cells degradation, under different ISOS protocols. In addition, this technique sheds light about where the governing degradation process is taking place, either at the active layer or at the intermediate layers and/or contacts. Here, we will present a degradation study in non-fullerene OSC with layer structure Ag /ZnO /PBDBT-ITIC /PEDOT, using IS. In addition, we will compare devices with and without the processing additive DIO in terms of pristine efficiency and devices stability.

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