The In-situ Nanoprobe at APS: Enabling Multimodal, In-situ and Operando Studies of Energy Materials
Sarah Wieghold a, Pedro Mercado Plozano a, Zhonghou Cai a, Jörg Maser a, Yanqi Luo a, Barry Lai a
a X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439, United States
Proceedings of MATSUS Fall 2025 Conference (MATSUSFall25)
A1 Halide Perovskites - Properties, Synthesis and Advanced Characterization - #PeroProp
València, Spain, 2025 October 20th - 24th
Organizers: Kunal Datta and Selina Olthof
Invited Speaker, Sarah Wieghold, presentation 086
Publication date: 21st July 2025

The hard X-ray In-situ Nanoprobe (ISN) beamline at 19-ID is one of the new feature beamlines built as part of the Advanced Photon Source Upgrade (APS-U) at Argonne National Laboratory. It is specifically designed to enable hierarchical, multimodal characterization of complex materials and devices under in situ and operando conditions, with high spatial resolution (down to 25–30 nm) and near-atomic sensitivity. The ISN is optimized to address key research challenges across a wide range of material systems—such as stability, degradation, (in)homogeneity–performance correlations, defect dynamics, and charge/discharge processes—with direct relevance to photovoltaics, energy storage, catalysis, and microelectronics.

The endstation employs Kirkpatrick–Baez (K–B) mirrors to achieve a diffraction-limited spot at 25 keV and covers a tunable X-ray energy range of 4.8–30 keV, enabling deep penetration and element-specific contrast. A 55 mm working distance allows flexible sample integration under realistic conditions. Available sample environments include temperature control (heating/cooling), gas and liquid flow, and applied electric fields, facilitating advanced functional material studies. Multiple contrast mechanisms are supported, including X-ray fluorescence (XRF) imaging for elemental and trace contaminant analysis, X-ray beam induced current (XBIC) and X-ray beam induced voltage (XBIV) for mapping electronic properties, auxiliary X-ray excited optical luminescence (XEOL) for optical characterization, X-ray diffraction (XRD) for structural insights, and ptychography for high-resolution imaging.

The ISN beamline offers a powerful and versatile platform for the correlated, nanoscale characterization of functional materials, providing unprecedented opportunities to unravel complex structure–property relationships in real-world operating environments.

This research was performed at the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science user facility at Argonne National Laboratory, and is based on research supported by the U.S. DOE Office of Science-Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

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