Hot-Carrier Trapping Preserves High Quantum Yields but Limits Optical Gain in InP-Based Quantum Dots
Sander Vonk a b, Tim Prins b h, Tong Wang c, Jan Matthys d, Luca Giordano d, Pieter Schiettecatte d, Navendu Mondal c, Jaco Geuchies e, Arjan Houtepen f, Jessi van der Hoeven b, Thomas Hopper c g, Zeger Hens d, Pieter Geiregat d, Artem Bakulin c, Freddy Rabouw b
a Swiss Federal Institute of Technology (ETH Zurich), Vladimir-Prelog-Weg, 1, Zürich, Switzerland
b Utrecht University, Heidelberglaan, 8, Utrecht, Netherlands
c Imperial college London, United Kingdom
d Ghent university, Krijgslaan 281, Gent, Belgium
e Leiden University, Leiden Institute of Chemistry, Leiden, 2300, Netherlands
f Technical University Delft, Delft, Netherlands
g University of Central Florida, 12424 Research Parkway Suite 400, Orlando, United States
h University of Amsterdam, Science Park 904, Amsterdam, 1098, Netherlands
Proceedings of MATSUS Fall 2025 Conference (MATSUSFall25)
E4 (Ultrafast) Spectroscopy for Energy Materials - #SpEM
València, Spain, 2025 October 20th - 24th
Organizers: Jaco Geuchies and Freddy Rabouw
Invited Speaker, Sander Vonk, presentation 089
Publication date: 21st July 2025

Colloidal indium phosphide (InP) quantum dots have emerged as the leading material for a wide range of commercial applications, particularly as bright luminescent colour converters in displays and lighting technologies. However, despite significant advances in InP-based nanocrystal synthesis and surface passivation, the community has yet to demonstrate robust optical gain under strong excitation conditions—a milestone routinely achieved with other quantum-dot materials. Here, we investigate the fundamental photophysical processes that limit the performance of state-of-the-art InP quantum dots as a gain medium. Using a multi-scale approach combining ensemble-based transient absorption and time-resolved photoluminescence spectroscopy spanning femtoseconds to microseconds with single-dot fluorescence-lifetime measurements, we uncover an ultrafast hot-carrier trapping mechanism unique to InP systems. Following high-energy photoexcitation, hot electrons are captured by traps on sub-picosecond timescales, resulting in charge-carrier losses during cooling. This rapid channel significantly reduces the net population inversion and, consequently, the achievable optical gain. Intriguingly, this hot-carrier trapping delays but does not quench photoluminescence, consistent with the high brightness observed under low-intensity illumination. A comparative analysis with CdSe, lead–halide perovskite, and CuInS2 quantum dots highlights the distinct hot-carrier dynamics of InP and shows that trap engineering is a critical next step for future performance improvements in high-power applications.

© FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
We use our own and third party cookies for analysing and measuring usage of our website to improve our services. If you continue browsing, we consider accepting its use. You can check our Cookies Policy in which you will also find how to configure your web browser for the use of cookies. More info