Publication date: 17th July 2025
Polycrystalline perovskite thin films are consistently associated with high performance optoelectronic devices. The main challenges currently under the spotlight lie with the stability and reliability of these devices, requiring a better understanding of the thin film surfaces and interfaces. However, very little is known about them. Given the soft nature of these materials, there is a struggle to directly assign the origin of the electronic features and to correlate them to the chemical nature of the surfaces. Here, by exploiting a multimodal approach, we measure for the first time, at sub-micron scales, the diffraction patterns of the thin film grain surface, which provide the material fingerprint, and its related electronic properties. Armed with this knowledge, we are eventually able to unambiguously assign the origin of the photoemission spectra for a wide library of metal halide perovskites. In lead halide perovskites, we identified their photoemission spectra to be the convolution of three different spectra, that of pristine perovskite, lead halide inclusions, and metallic lead. In particular, metallic lead is identified to be the origin of the often-reported mid-gap photoemissive states, generally assigned to deep electronic states within the halide perovskite semiconductor band gap. The chemical composition of the metal halides, the photo-degradation of the perovskites under visible light, and the quality of the precursors heavily define the presence of such states. Overall, the achievement of such understanding elucidates the origin of carrier loss, photo-degradation, and sample reproducibility, aiding in the targeted improvement of the stability and reliability of these metal halide perovskites and their associated optoelectronic devices.