Publication date: 21st July 2025
Over the past decade, perovskite photovoltaics have made remarkable progress, with the best lab-scale cells now achieving close to 27% power conversion efficiency. These gains come from a deeper ability to engineer and passivate the interfaces inside the cell. Yet high efficiency is only half the story: the very passivation strategies that unlock record voltages and fill factors can introduce new routes to degradation, leaving stability lagging behind. In this talk, I will trace how light- and heat-induced stresses activate instabilities at critical interfaces. One example is the thermal decomposition of ammonium-based passivation ligands that were initially chosen to suppress non-radiative recombination. Another example is halide ions migrating across the perovskite/transport-layer junction and penetrating as far as the electrode. I will also examine chemical mismatches—such as acidic hole-transport layers contacting lead-halide perovskites—that accelerate interface breakdown. Finally, I will outline emerging strategies to arrest these pathways, including diffusion barriers, thermally robust molecular passivants, and interface-benign transport materials.