Publication date: 21st July 2025
Semiconductor nanocrystals often suffer from low multiexciton quantum yields, which limits their performance in high-flux optoelectronic applications, such as lasing and high intensity lighting. Multiexciton quantum yields, and the related Auger rates, are often measured either through single particle fluorescence or solution phase ensemble measurements. However, neither of these environments resembles that of an opto-electronic device. Therefore, a reliable way to experimentally determine the quantum yield and dynamics of multiexciton states in nanocrystals in densely packed thin-films is needed. Second order photon correlation measurements allow us to measure the biexciton-to-exciton quantum yield ratio and biexciton lifetime of an ensemble of nanocrystals freely diffusing in solution. We demonstrate second-order photon correlation spectroscopy across films with particle densities much higher than traditional single particle spectroscopy samples. We extract the average single nanocrystal biexciton properties from this thin-film sample of nanocrystals and compare to the results obtained from traditional single particle spectroscopy, providing insight into the impact of film morphology on multiexciton properties.
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