Publication date: 15th December 2025
Electron ptychography — a computational phase-contrast method that reconstructs the sample’s transmission function from overlapping scanning-diffraction patterns — is rapidly becoming a practical tool for resolving the atomic structure of complex nanomaterials far beyond conventional depth-of-focus and coherence limits. For materials synthesis and nanoscale structure–property research, this capability opens a new window into interfaces, confined phases, defect networks, and metastable structural motifs that govern functional behavior.
We present three recent advances that make 3D ptychographic imaging more broadly applicable to real nanomaterial systems. First, using tomographic 4D-STEM tilt-series acquisition, we resolve the atomic lattice of a Zr–Te phase confined in double-wall carbon nanotubes, demonstrating that ptychographic single-slice tomography can identify intricate polytypes and nanoscale structural distortions relevant to templated growth. Second, a multi-slice reconstruction coupled with joint tomographic alignment overcomes the depth-of-focus barrier of conventional linear tomography, enabling atomic-resolution imaging across tens of nanometers of heterogeneous material.
Third, we introduce an end-to-end reconstruction framework that incorporates all physical effects to achieve near-isotropic 0.8 Å 3D resolution even under extreme missing-wedge conditions. This makes it feasible to recover the internal structure of nanoparticles, nanowires, and confined phases from sparsely sampled or limited-angle datasets, as often required for beam-sensitive or geometrically constrained materials.
Finally, we will report on our efforts to extend ptychography into the in-situ regime by tracking the growth behavior of Ir/Ir-oxide nanoparticles inside ~60 nm-thick liquid cells. Imaging small nanocrystals in thick liquid with lattice resolution enables direct observation of nucleation pathways, redox dynamics, and morphological evolution under realistic electrochemical and synthesis conditions, connecting atomic-scale structure to functional performance.
Together, these developments turn 3D electron ptychography — in both ex-situ and in-situ modes — into a powerful platform for discovering how atomic arrangements shape the emergent properties of modern nanomaterials.
