Publication date: 15th December 2025
CsPbBr3 microcrystals washing strategy enabling low dark current and improved limit of detection for X-ray detection
Nil Monrós Oliveras,1 Bapi Pradhan,1 Elke Debroye1
1Department of chemistry, KU Leuven, Belgium
nil.monrosoliveras@kuleuven.be
All-inorganic CsPbBr₃ perovskite has emerged as a potential material for optoelectronic applications such as solar cells, LEDs, photodetectors, and X-ray detectors, owing to its superior charge-transport properties, long carrier diffusion length, and broad light absorption.[1] In contrast to its organic counterparts such as MAPbBr₃ (MA = methylammonium), all-inorganic CsPbBr₃ exhibits superior photostability, thermal stability, and moisture stability, making it a suitable candidate for high-energy radiation detection.[2]
Dimethyl sulfoxide (DMSO) is a widely used solvent for the synthesis of halide perovskites (HPs); nevertheless, its intrinsically high viscosity and boiling point can lead to degradation and reduced optoelectronic performance in the resulting perovskite films due to DMSO trapping during film formation, which generates voids.[3] One of the major issues with CsPbBr₃ is the large dark current generated by the intrinsic ionic-migration nature of the material, film quality and device architecture.[2] Such large dark currents can compromise device stability and degrade X-ray image quality.
In this presentation, I will discuss the synthesis of CsPbBr₃ microcrystals (~20/50 μm) for X-ray detection. I will elaborate on the impact of washing these DMSO-synthesized microcrystals with different solvents (such as ethanol (EtOH) and ethyl acetate (EA)) and examine how these solvents affect the structural, optical, and X-ray detection properties of CsPbBr₃ microcrystals. To evaluate their practical applicability, proof-of-concept X-ray detectors based on wafers composed of these microcrystals have been developed.
Compared with their non-washed counterparts, CsPbBr₃ microcrystals washed with a combination of EA and EtOH exhibit a reduced dark current and suppressed dark-current drift. These results hint on reduced void generation leading to an improved on/off ratio and an X-ray limit of detection (LoD) decreased by more than one order of magnitude. This performance is very promising for the generation of future X-ray detector devices with a long-term robust response.
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