Publication date: 15th December 2025
Cesium lead bromide (CsPbBr3), a promising direct X-ray detector material, faces challenges due to the instability of its dark current, which is often attributed to the movement of mobile ions under an electric field. However, direct measurement of ions movement in perovskite has been seldom reported. Using grazing incidence X-ray fluorescence (operando GIXRF) on CsPbBr3 polycrystalline thick films (~200µm), we directly investigated the accumulation of ions under the electrode under bias [1]. A quasi monochromatic X-rays beam with energy of 17.5 keV (Mo Kα line) excites the material at low angle (0.5°) to probe the sample surface. X-ray fluorescence was monitored from a normal angle and the dark current is registered during the experiment. Our findings reveals that both Cs+ and Br- ion (or their vacancy counterpart) migrate, accumulating under or moving away the electrode according to the electric field direction, while Pb remains stable. Over a few hours, accumulation rates exhibit a linear relationship with the electric field, with coefficients of ~2 × 10−3 % h-1V-1mm for Br and Cs. The dark current and the ion accumulation correlate, and the current drift for positive bias is thousand times higher than that for negative bias because of asymmetrical Cr/CsPbBr3/ITO contact. Long term accumulation of species should lead to material modification. Phase modification was probed using Bragg-Brentano diffraction (operando XRD). Under long term polarization, evidence of decomposition of CsPbBr3 into CsBr, Cs4PbBr6 and CsPb2Br5 was observed, which also correlates with dark current drift. Overall, this study provides valuable insights into ion movement within CsPbBr3, potentially aiding development of more stable X-ray detectors.
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