Publication date: 15th December 2025
Hybrid metal‑halide perovskites (MHPs) promise low‑cost, high‑efficiency solar cells, yet their macroscopic performance is limited by loss pathways that originate in nano‑ and microscale structures. Thus, to understand MHP materials requires the characterization of the many nano- and microscale structures; from sub-granular twin domains, over grain boundaries and interfaces to lateral variations in crystal grains orientations and facets. Electrical SPM operation modes like Kelvin probe force microscopy (KPFM) or conductive atomic force microscopy are ideally suited to decipher these structure-function relationships. In this presentation, I will present some of our recent activities in the development of specialized scanning probe microscopy methods to study hybrid perovskite materials.
As one single measurement technique cannot capture the full picture, we develop a combined optical‑scanning‑probe platform that integrates spatially resolved photoluminescence (PL), time‑resolved PL (TRPL) and electrical scanning probe microscopy (Kelvin‑probe force microscopy, conductive AFM and nanoscale surface‑photovoltage spectroscopy). This multimodal microscope allows simultaneous measurements of the same region with diffraction‑limited confocal PL spectroscopy (≈300 nm lateral resolution), time-resolved photoluminescence (TRPL, time-resolution ~ps) and quantitative electrical AFM (10-20 nm lateral resolution). This nanoscale photovoltaics lab on a tip therefore bridges the long‑standing divide between optical spectroscopy and nanoscale electrical probing. By delivering a correlative view of band‑gap emission, carrier dynamics and electrostatic landscape, it enables quantitative identification of the dominant nanoscale loss mechanisms that limit MHP solar‑cell performance. The approach can be extended to other emerging photovoltaic materials and offers a powerful tool for rational engineering of grain boundaries, transport layers and compositional stability.
