Publication date: 15th December 2025
The relationship between structure and properties is elementary for the applications of crystalline solids. Because of the increasing complexity in materials on different length scales, the development of advanced methods for structure analysis are needed.
In the shadow of X-ray crystallography, nearly 100 years after the discovery of the wave character of electrons, electron crystallography has evolved to encompass both imaging and diffraction techniques, enabling crystallographic analysis of micro- and nanostructures with atomic resolution.
Thanks to the development of the tomographic data acquisition 15 years ago, electron diffraction has been rediscovered and continuously developed since then, making it possible to analyse tiny single crystals analogous to single crystal X-ray diffraction. This allows nowadays, on the one hand, determining the structure of small particles, and on the other, to even investigate crystal structures of beam sensitive small molecule structures.[1]
The extensive structural exploration of current material classes such as organic and layered materials,[2,3] switchable semiconductors,[4,5] porous catalysts,[6] and battery materials[7] is in numerous cases only successful with three-dimensional electron diffraction (3D ED). Therefore, the method has become highly attractive in the field of materials science.
Yaşar Krysiak thanks Dr. Rolf M. Schwiete Stiftung (project number 2025-039) and Fonds der Chemischen Industrie (project number SK 216/09) for financial support.
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