Publication date: 15th December 2025
Efficient photosystems for solar-to-chemical energy conversion are often based on nanostructured semiconductor architectures. In these material systems, the nanoscale
properties frequently dominate the performance at the macroscale. Therefore, local understanding of their charge transfer and transport properties is decisive for optimizing
their efficiency and stability.
To this end, we correlate Kelvin probe force microscopy (KPFM) and (photo)conductive atomic force microscopy (AFM) to study the local band bending, charge accumulation,
as well as variations in the generated surface photovoltage and (photo)conductivity. However, analyzing nanostructured materials with complex morphologies is not trivial, as effects such as topographic crosstalk or surface potential averaging can significantly influence the results obtained with different techniques. To overcome these issues, we leverage 2nd eigenmode and heterodyne KPFM measurements with improved resolution and sensitivity compared to conventional frequency- and amplitude-modulated techniques. For (photo)conductive AFM, a special tapping mode with simultaneous current measurements is used to reduce sample and probe damage, enabling measurements on polycrystalline films. For BiVO4, one of the most extensively studied metal oxide photoanode materials, we compare different KPFM modes and correlate the results with local conductivity measurements to gain insights into local semiconductor properties at grain boundaries or different crystal facets. Overall, the gained nanoscale insights will put forward the development of rational design strategies to enhance the macroscale durability and efficiency of solar energy conversion systems.
