Publication date: 15th December 2025
Understanding energy-loss mechanisms in perovskite materials and their photovoltaic devices under real operating conditions is essential for advancing perovskite solar cells toward commercial viability. Optical spectroscopy, a non-contact and non-invasive technique, is a powerful tool widely used to probe charge-carrier losses in perovskite materials and devices. While many studies have focused on non-radiative recombination in neat perovskite films—correlating these losses to open-circuit voltage (VOC)—this work emphasizes charge-extraction losses under realistic conditions, such as maximum power point and short-circuit operation, using operando photoluminescence (PL) and hyperspectral PL microscopy. [1]
Nanoscale heterogeneities, including iodine vacancies, grain boundaries, and imperfect contact layers, can induce ion migration, surface failures, and inefficient charge extraction. These defects often limit performance, causing severe non-radiative losses and accelerated degradation. Here, we demonstrate how advanced operando and hyperspectral PL techniques reveal the impact of these inhomogeneities on charge-carrier dynamics. Operando spectroscopy quantifies energy losses across all working voltages due to charge accumulation, while hyperspectral PL microscopy visualizes these losses from the nanoscale to millimeter scale.
Finally, we present successful mitigation strategies—such as precursor engineering, process optimization, and interlayer development—that significantly enhance charge-extraction efficiency and device stability.[2-4]
This presentation was supported by the Engineering and Physical Sciences Research Council (EPSRC, EP/V027131/1)
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