Publication date: 15th December 2025
Transition metal oxides are being investigated for many energy related applications, such as energy storage and catalysis. Their properties are dictated by various degrees of spin, charge, orbital and lattice degrees of freedom. To help gain a full understanding, give insight and ultimately control of these degrees of freedom, monitoring in situ and operando techniques are a prerequisite, both during the fabrication as well as the usage of these materials. In the preparation and operation of thin films made by physical vapor techniques, the methods are quite developed in recent years, especially in lab based systems. In this presentation I will review optical, electron and X-ray techniques used with and on pulsed laser deposition of oxide thin layers and heterostructures. The measurements, typically give information about the nomical valence of the transition metal element(s), their local and global crystal symmetry. In addition, I will also discuss various options to prepare (quasi) epitaxial oxide thin films and membranes for further operando experiments.
Acknowledgements are extended to Jeroen Huijben for prepararing the ToC graphic. Chris Beumer and Guus Rijnders are acknowledged for useful discussions.
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