Investigation of Electric Field Induced Ionic Diffusion in Perovskite Solar Cells by X-ray Photoelectron Spectroscopy
Yuxiang Guan a, Luis Ono a, Ryota Kabe a
a Okinawa Institute of Science and Technology Graduate University (OIST), 904-0495, Japan, Okinawa, Japan
Proceedings of MATSUS Spring 2026 Conference (MATSUSSpring26)
G2 Monitoring the degradation mechanisms of photovoltaic devices by optoelectronic characterization
Barcelona, Spain, 2026 March 23rd - 27th
Organizers: Enrique H. Balaguera and Emilio J. Juarez-Perez
Poster, Yuxiang Guan, 665
Publication date: 15th December 2025

Metal halide perovskites have attracted significant attention as next-generation semiconductor materials for photovoltaic applications due to their unique synergistic effects originating from the organic and inorganic cage crystal structure. However, the long-term stability of encapsulated perovskite solar cells (PSCs) still remains one of the most important challenges for the commercialization of this emerging technology.1 Encapsulation engineering helps improve the stability of PSCs against ambient air exposure. However, the degradation of these encapsulated PSCs still continues to be a concern as they approach the commercialization phase. The ion migration phenomenon within PSCs is identified to have an impact on the lifetime of encapsulated PSCs. In this study, we propose an in situ methodology to investigate the ion migration dynamics in perovskite solar cells under ultrahigh vacuum (UHV) conditions employing X-ray photoelectron spectroscopy (XPS). Employing our methodology, the additive strategies as well as designed functional molecules as ion immobilizers are compared.2 Due to the higher chemical sensitivity of XPS, our methodology will enable a more precise comparison of different ionic diffusion phenomena not only in perovskite semiconductor materials but also in other related topics.3

The funding support from the Organic Optoelectronics Unit, Okinawa Institute of Science and Technology Graduate University is acknowledged.

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