Advancing Battery Materials through Operando and High Throughput X-ray Diffraction techniques
Montse Casas Cabanas a b
a CIC energiGUNE, Basque Research and Technology Alliance (BRTA), Alava Technology Park, Albert Einstein 48, 01510 Vitoria-Gasteiz, Spain
b Ikerbasque Basque Foundation for Science, Plaza Euskadi 5, Bilbao 48009, Spain
Proceedings of MATSUS Spring 2026 Conference (MATSUSSpring26)
G4 In situ/operando characterization of energy-related materials with synchrotron X-ray techniques
Barcelona, Spain, 2026 March 23rd - 27th
Organizers: Carlos Escudero and Juan Jesús Velasco Vélez
Invited Speaker, Montse Casas Cabanas, presentation 681
Publication date: 15th December 2025

Operando X-ray diffraction (XRD) experiments have become a powerful and widely adopted technique for tracking internal processes during battery cycling. They provide critical insights into fundamental electrochemical redox mechanisms and aging phenomena in battery materials. However, obtaining high-quality, representative and actionable data from operando measurements requires careful control of numerous experimental parameters (including cell configuration, electrode preparation, goniometer geometry, data acquisition protocols and dose).1,2

In this presentation, we will explore key factors that determine the success of operando synchrotron experiments, such as cell design, experimental setup and sample preparation. These concepts will be illustrated through case studies demonstrating how operando XRD can reveal the electrochemical signatures of diverse battery materials.

At the same time, the vast amount of diffraction data generated by high-throughput screening and operando studies at large-scale facilities demands advanced software solutions capable of real-time analysis, moving beyond traditional post-experiment pattern-by-pattern workflows. To address this need, we will introduce FullProfAPP, a software platform built on the foundations of the FullProf program, designed to process, refine, and visualize large collections of powder diffraction patterns efficiently.3

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