Publication date: 15th December 2025
Perovskite photovoltaics are often assumed to require cleanroom manufacture, yet scalable production will increasingly occur in industrial environments where settled dust is unavoidable. We introduce a method that allows the quantification of how non-conductive particulates influence device formation, performance and reliability across planar and mesoscopic architectures. Using a monitored dust-circulation box to deliver reproducible particle loads, planar n-i-p devices were fabricated with dust introduced at selected interfaces in both a printed carbon contact stack and a conventional spiro/Au stack. Despite visible microstructural disruption and local inactive regions in electroluminescence maps, photovoltaic metrics showed only modest, interface-dependent losses and thermal ageing of MAPI films followed similar pathways with and without dust. In parallel, screen-printed triple mesoscopic carbon cells were assessed with dust at printing interfaces and within pastes. Here, spatial variability increased due to local print thinning, altered roughness and occasional infiltration defects observed in microscopy and cross-sections. Finally, we highlight how particle-induced shading can create local reverse bias, promoting shunt growth, and possible hotspot formation, linking manufacturing contamination to field reliability.
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