Publication date: 15th December 2025
As OPV continues to gain interest as a complimentary green energy solution to silicon and perovskite, an understanding on the photo-degradation response is critical for designing materials to simultaneously attain high efficiency and stability. AFM-IR presents a powerful technique in visualizing the nanoscale material distribution by mapping photothermal responses of materials across surfaces. In this work, we characterized as-cast and photo-degraded polymer:non-fullerene thin films with the incorporation of an antioxidant. We observed a distinct difference between the height and the IR images, which benefits charge dissociation. With the incorporation of antioxidant, a different degradation pattern from both the height and the IR image (material distribution) was observed. Additionally, AFM-IR allows spectra to be acquired at defined positions on the thin film, when compared with FT-IR, the peaks position overlapped but the intensities varied depending on the location. Overall, the technique yielded a visual map of the material distribution that confirmed by IR spectrum
We acknowledge European Union´s Horizon Europe MSCA-DN program OPVStability (Grant Agreement Nr. 101120262) for financial support
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