Proceedings of nanoGe Fall Meeting19 (NFM19)
Publication date: 18th July 2019
The hole transport layer and the back electrode are known to be very important factors that determine the stability of the organic photovoltaic (OPV) modules. In particular, PEDOT: PSS, the most widely used hole transport material, is considered to be a factor causing serious deterioration of OPV modules. In this study, the thermal stability of the OPV modules with inverted structures of indium tin oxide/ZnO/photoactive layer/PEDOT:PSS/Ag according to the inner layer characteristics was investigated. Thermal acceleration tests were conducted on the OPV modules, and thermal stability of the organic solar cell was evaluated according to the properties of the hole transport layer PEDOT: PSS. As a result, it was confirmed that deterioration of the OPV module is accelerated as the heating temperature is increased from 65 ° C to 85 ° C. The degradation of the OPV module was mainly attributed to the decrease in the open voltage (Voc). On the contrary, the stability of the Voc is enhanced when the PEDOT:PSS is thicker and contains polar solvent DMSO as an additive. Also, microscope images of the active layers show that the surface attributes change due to a residual solvent of printed Ag electrode, thereby resulting in a thermally-induced drop in the short circuit current density (Jsc). The results are expected to offer comprehensive understanding of the thermal degradation mechanism of OPV modules and suggest strategic solutions.
This work was supported by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea (No. 20163010012200)
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