Proceedings of nanoGe Fall Meeting 2021 (NFM21)
Publication date: 23rd September 2021
Understanding the device degradation mechanism is crucial for polymer solar cells (PSCs) commercialization. Here, the shelf degradation of PTB7-Th:PC70BM PSC with different electron transport layers (ETL) is investigated in accordance with ISOS-D1 protocol using a combined frequency and time resolved techniques. Both techniques provide an insight into how devices with different ETL were degraded and affected the active layer. Transient photovoltage / transient photocurrent (TPV / TPC) deliver information of the increasing trap density in the active layer upon degradation. Impedance spectroscopy (IS) promotes the change of interface trap density due to the defect of ETL/active layer interface upon degradation.
European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No. 713679, Spanish Ministerio de Ciencia, Innovación y Universidades (MICINN/FEDER) RTI2018-094040-B-I00 by the Agency for Management of University and Research Grants (AGAUR) ref. 2017-SGR-1527 and from the Catalan Institution for Research and Advanced Studies (ICREA) under the ICREA Academia Award.
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