In-situ Monitoring of Complex Perovskite and CIGS Thin Films by Reflectance Spectroscopy in Various Environments
Christian Camus a, Christian Kaspari a, Carolin Rehermann b, Madeleine Justianto a, Stefan Paetel c, Eva Unger b
a LayTec AG, Seesener Straße, 10-13, Berlin, Germany
b Helmholtz-Zentrum für Materialien und Energie GmbH, HySPRINT Helmholtz Innovation Lab, 12489 Berlin, Germany, Albert-Einstein-Straße, 16, Berlin, Germany
c Zentrum für Sonnenenergie‐ und Wasserstoff‐Forschung Baden‐Württemberg (ZSW) Stuttgart, Germany, Meitnerstraße, 1, Stuttgart, Germany
Proceedings of nanoGe Fall Meeting 2021 (NFM21)
#PerNC21. Perovskites II: Synthesis, Characterization, and Properties of Colloidal
Online, Spain, 2021 October 18th - 22nd
Organizers: Maksym Kovalenko, Ivan Infante and Lea Nienhaus
Poster, Christian Camus, 294
Publication date: 23rd September 2021

Perovskite and CIGS materials are well-suited for fabricating highly efficient thin film solar cells and modules. For both materials the correct process sequence is crucial to initiate the appropriate reaction paths leading to the optimum layer properties and device performance. In-situ metrology by means of reflectance spectroscopy constitutes a very powerful technique for monitoring a large variety of deposition and film formation techniques such as spin-coating, annealing or co-evaporation. In this poster, an overview about recent results obtained for perovskite spin-coating and CIGS evaporation are presented.

© Fundació Scito
We use our own and third party cookies for analysing and measuring usage of our website to improve our services. If you continue browsing, we consider accepting its use. You can check our Cookies Policy in which you will also find how to configure your web browser for the use of cookies. More info