Proceedings of International Conference on Perovskite Thin Film Photovoltaics and Perovskite Photonics and Optoelectronics (NIPHO25)
Publication date: 24th April 2025
Atomic layer deposition of aluminum oxide (ALD-Al2O3) layers has recently been studied for stabilizing perovskite solar cells (PSCs) against environmental stressors and mitigation of pernicious halide ion migration from the perovskite towards the hole transport interface. [1] However, its effectiveness in preventing the infiltration of ions and additives from the hole-transport layer into perovskites remains insufficiently understood. [2]
Herein, we demonstrate the deposition of a compact ultrathin (<0.75 nm) ALD-Al2O3 layer that conformally coats the morphology of a triple-cation perovskite layer (see TOC). This promotes an effective contact of the hole transporter layer on top of the perovskite, thereby improving the charge carrier collection between these two layers. Upon systematically investigating the layer-by-layer structure of the PSC, we discovered that ALD-Al2O3 also acts as a diffusion barrier for the degraded species from the adjacent transport layer into the perovskite. In addition to these protective considerations, ALD-Al2O3 impedes the transition of crystalline perovskites to an undesired amorphous phase. [3] Using a combination of spectroscopy, diffraction, and microscopy techniques, our study contributes to a holistic understanding of decoupling the final device degradation from the instability caused by ion migration from the perovskite material and by the residues from the degraded charge extraction layer into the perovskite. [3] Consequently, the dual functionality (i.e., enhanced contact and diffusion barrier) of the ALD-Al2O3 protection enhanced the device stability, retaining 98% of its initial performance compared to <10% for pristine devices after 1500 h of outdoor testing (ISOS-O-L) under ambient conditions. Finally, this study deepens our understanding of the mechanism of ALD-Al2O3 as a two-way diffusion barrier, highlighting the multifaceted role of buffer layers in interfacial engineering for the long-term stability of PSCs.
M. S., M. K., and C. D. thank Helmholtz Young Investigator Group FRONTRUNNER. M. S., M. K., and C. D. acknowledge the CERIC-ERIC Consortium for access to experimental facilities and financial support (proposal number 20232163). M. K. and M. S. also acknowledge the VIPERLAB project financed by the European Union’s Horizon 2020 (grant agreement No. 101006715). The authors gratefully acknowledge the core facility SRF AMICA (Stuttgart Research Focus Advanced Materials Innovation and Characterization) at the University of Stuttgart for their support and assistance
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