Proceedings of International Conference on Perovskite Thin Film Photovoltaics and Perovskite Photonics and Optoelectronics (NIPHO25)
Publication date: 24th April 2025
Perovskite solar cells (PSCs) are among the most promising next-generation photovoltaic technologies, combining high efficiency with low manufacturing costs. However, long-term stability remains a critical barrier for commercialization. One of the primary degradation mechanisms is chemical instability and ion migration within the perovskite layer, which leads to performance losses and phase instability.
Light-induced degradation in organo-lead halide perovskites, such as (FA₀.₈₃MA₀.₁₇)₀.₉₅Cs₀.₀₅Pb(I₀.₈₃Br₀.₁₇)₃, is initiated by the generation of iodide interstitials at the interfaces between the perovskite layer and the adjacent charge transport layers. These small, mobile anions redistribute under voltage stress, altering the built-in potential of the device and migrating toward the thin Ag electrode, where they contribute to resistance changes and the formation of corrosive AgI. While trap annihilation of certain iodide defects occurs near the anode, the accumulation of negatively charged iodide interstitials near the cathode has been found to be particularly detrimental to solar cell efficiency.
This project aims to investigate ion migration phenomena using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), a high-resolution technique capable of depth-profiling chemical species with sub-micron spatial precision. To enhance interpretation of ion movement in relation to material morphology and surface potential, Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KPFM) will be integrated into the workflow. The combination of these tools provides a powerful approach to visualizing both the static and dynamic distribution of mobile ions, such as halides, under various stress conditions.
In the initial phase of the project, a comprehensive literature review has been conducted to map current understanding and identify methodological gaps. The lab work, initiated recently, focuses on sample preparation protocols and ToF-SIMS depth profiling of PSC stacks. Early experiments are underway, and preliminary results will be shared.