Publication date: 25th September 2020
Small perturbation techniques have been widely used for the investigation of perovskite solar cells and have helped understand important aspects of their operation. An adequate interpretation of the spectra given by impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS) and intensitymodulated photovoltage spectroscopy (IMVS) is key for the understanding of device operation. The utilization of a correct equivalent circuit to fit the spectra and extract real parameters is needed to get this information and provide a proper interpretation. In this work, we present an equivalent circuit based on previous studies [1],[2] which is able both to reproduce the most general features and also the exotic behaviours found in impedance spectra. From the measurements, we demonstrate that the mid-frequency features that appear in IS spectra clearly depend on the active layer thickness and we prove the spectral correlation of the three techniques that has been suggested theoretically.[3]
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