What Affects the Reproducibility of Perovskite Photovoltaic Devices?
Yana Vaynzof a
a Kirchhoff-Institute for Physics, Ruprecht-Karls-University Heidelberg, Im Neuenheimer Feld, 227, Heidelberg, Germany
Proceedings of International Conference on Advances in Organic and Hybrid Electronic Materials (AOHM19)
Dubrovnik, Croatia, 2019 March 17th - 20th
Organizers: Alejandro Briseno, Thuc-Quyen Nguyen and Natalie Stingelin
Invited Speaker, Yana Vaynzof, presentation 046
DOI: https://doi.org/10.29363/nanoge.aohm.2019.046
Publication date: 8th January 2019

The last five years have witnessed remarkable progress in the field of lead halide perovskite materials and devices. Examining the existing body of literature reveals staggering inconsistencies in the reported results among different research groups with a particularly wide spread in the photovoltaic performance and stability of devices. Focusing on two model systems, namely methylammonium lead triiodide (MAPbI3) and triple cation Cs0.05(FA0.83MA0.17)0.95Pb(Br0.1I0.9)3 perovskite, we investigate how minor, likely unintentional, variations in the fabrication procedure of the perovskite layer may affect its properties and consequently those of the complete photovoltaic devices.

In the case of MAPbI3, we demonstrate that fractional deviations in precursor stoichiometry result in significant changes to the surface composition and energetics, crystallinity, emission efficiency and the energetic disorder of the perovskite layers. These variations result in a spread of photovoltaic performance and significant disparities in device stability.[1] Additionally, layers deposited from the same precursor solution may exhibit large-scale lateral inhomogeneities in their composition and electronic structure, resulting in variations in photovoltaic performance of devices fabricated on the same substrate.[2]

In the case of triple cation perovskites, we find that it is the anti-solvent quenching step that determines the reproducibility of the fabricated devices. We also find that variations in device performance and stability are not always coupled, with devices of equal initial performance showing drastically different lifetimes depending on slight changes in the fabrication procedure.

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