Understanding the Origin of Performance Limiting Traps in Halide Perovskite
Tiarnan Doherty a, Sam Stranks a
a Optoelectronics Group, Cavendish Laboratory, University of Cambridge, UK., J.J. Thomson Avenue, Cambridge, United Kingdom
International Conference on Hybrid and Organic Photovoltaics
Proceedings of 13th Conference on Hybrid and Organic Photovoltaics (HOPV21)
Online, Spain, 2021 May 24th - 28th
Organizers: Marina Freitag, Feng Gao and Sam Stranks
Invited Speaker Session, Tiarnan Doherty, presentation 076
Publication date: 11th May 2021

Authors: Tiarnan A.S. Doherty1§, Andrew J. Winchester2§, Stuart Macpherson1, Duncan N. Johnstone3, Vivek Pareek2, Elizabeth M. Tennyson1, Sofiia Kosar2, Felix U. Kosasih3, Miguel Anaya1, Mojtaba Abdi-Jalebi1, Zahra Andaji-Garmaroudi1, E Laine Wong2, Julien Madéo2, Yu-Hsien Chiang1, Ji-Sang Park4, Young-Kwang Jung5, Christopher E. Petoukhoff2, Giorgio Divitini3, Michael K. L. Man2, Caterina Ducati3, Aron Walsh4,5, Paul A. Midgley3, Keshav Dani2*, Samuel D. Stranks1*

Metal halide perovskite (MHP) materials exhibit exceptional performance characteristics for low-cost optoelectronic applications. Though widely considered defect tolerant materials, perovskites still exhibit a sizeable density of deep sub-gap non-radiative trap states, which create local variations in photoluminescence [doi: 10.1126/science.aaa5333] that fundamentally limit device performance. These trap states have also been associated with light-induced halide segregation in mixed halide perovskite compositions [doi: 10.1021/acsenergylett.8b02002] and local strain [doi:10.1039/C8EE02751J], both of which can detrimentally impact device stability. The origin and distribution of these trap states remains unknown as multiple, complimentary multi-modal techniques are required to probe their location and surrounding structure and composition and MHPs damage rapidly under the electron beam. Understanding the nature of these traps will be critical to ultimately eliminate losses and yield devices operating at their theoretical performance limits with optimal stability. In this talk, we outline a low dose, multiple – metrological framework to reveal the structural origins of non-radiative recombination sites in (Cs0.05FA0.78MA0.17)Pb(I0.83Br0.17)3 thin films. By combining scanning electron diffraction and energy dispersive X-ray spectroscopy, with photoemission electron microscopy (PEEM) measurements we reveal that nanoscale trap clusters are distributed non-homogenously across the surface of high performing perovskite films and that there are distinct structural and compositional fingerprints associated with the generation of these detrimental sites.

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