Proceedings of Asia-Pacific International Conference on Perovskite, Organic Photovoltaics and Optoelectronics (IPEROP27)
Publication date: 22nd October 2026
Perovskite solar cells (PSCs) have demonstrated remarkable power conversion efficiencies; however, their long-term operational stability remains a major challenge for commercialization. Conventional degradation studies often require thousands of hours of testing, highlighting the need for accelerated aging protocols that rapidly reveal degradation mechanisms while remaining relevant to real operating conditions. In this work, we develop an accelerated intrinsic degradation methodology based on the ISOS-L2 protocol by combining elevated temperature at 65oC, continuous 1 Sun illumination, and electrical bias stress. PSCs were aged for more than 400 h under either open-circuit (VOC) or maximum power point (VMPP) conditions. Experimental observations were further interpreted using drift–diffusion (DD) simulations to identify the dominant degradation pathways. We show that devices aged under VOC exhibited substantially faster degradation than those aged under VMPP. After more than 400 h, the power conversion efficiency of VOC-aged devices decreased by approximately 40%, whereas VMPP-aged devices showed a reduction of only ~10%. Despite this large difference in performance loss, both aging conditions resulted in only minor reductions in VOC (<5%), suggesting that increased non-radiative recombination is not the dominant degradation mechanism. Instead, the most pronounced degradation under VOC stress was observed in the short-circuit current density (JSC) and fill factor (FF), which decreased by approximately 17% and 25%, respectively. In contrast, devices aged under VMPP showed much smaller reductions in JSC (~5%) and FF (~4%). DD simulations indicate that these losses are associated with reduced carrier mobility and increased interfacial trap-assisted recombination, likely caused by the formation of electrically active defects during aging. Additional reductions in shunt resistance may further accelerate degradation under VOC conditions. These results demonstrate that electrical operating conditions strongly influence degradation pathways and provide important insights for developing accelerated stability tests for PSCs.
This work was supported by the Australian Government through the Australian Renewable Energy Agency and Australian Centre for Advanced Photovoltaics. Responsibility for the views, information, or advice expressed herein is not accepted by the Australian Government.
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