Publication date: 22nd July 2026
Metal halide perovskites are often viewed as electronically defect tolerant semiconductors. At the same time, their mixed ionic-electronic character and chemical reactivity can drive unexpected degradation pathways involving electrode materials. In particular, noble metals commonly employed as device contacts are not always chemically inert and can participate in electrochemical reactions that lead to metal transport through perovskite layers. In this talk, I will discuss how studies of gold migration in perovskite devices have led to a broader understanding of metal transport and doping in halide perovskites. I will describe how electrochemically generated noble-metal cations can form, migrate, and interact with the perovskite lattice, influencing both device stability and electronic properties. These findings suggest that metal transport should not be viewed solely as a degradation mechanism, but also as a potential route to dynamic doping and new device functionality. Finally, I will explore whether the electrochemical processes that limit long-term stability of perovskite optoelectronic devices be harnessed as useful functionality? Examples including dynamic doping and resistive switching suggest that the boundary between degradation and operation may be less distinct than traditionally assumed. Understanding this relationship may prove important both for realizing durable perovskite technologies and for developing new classes of adaptive electronic devices.
