Photoluminescence (PL) imaging has long been used to map optoelectronic properties in perovskite solar cells [1]. Recent PL imaging at millimetre length scales has revealed significant spatial heterogeneity across full device areas, including local variations in recombination and charge-collection quality [2,3]. PL imaging is now an established diagnostic tool for single-junction perovskite solar cells [1,2,4], providing a complementary perspective to microscopic techniques and enabling direct assessment of uniformity, scalability, and processing strategies. Extending PL imaging to tandem architectures enables junction-resolved analysis of performance losses, sequential-deposition effects, and behaviour under electrical bias. However, multijunction devices present significant experimental challenges, requiring both selective excitation of individual junctions and spectral isolation of their emission. While achievable in two-junction devices [5,6], the challenge increases substantially with additional junctions. Here, we present a PL imaging system for simple, rapid, junction-selective characterisation of all-perovskite tandems with up to four junctions. Selective excitation is combined with filtered visible and infrared detection to isolate emission from individual absorber layers. This enables separate photoluminescence quantum efficiency (PLQE) measurements for each junction and spatially resolved comparison across a 0.25 cm² device area. From the PLQE, we can extract quasi-Fermi level splitting (QFLS) maps for each junction, allowing direct comparison between single-junction reference devices and the same perovskite absorbers after tandem integration. This reveals how incorporation into a multijunction stack changes both the magnitude and spatial uniformity of internal optoelectronic properties. In two-junction all-perovskite tandems, the method separates the contributions of the wide- and narrow-bandgap junctions, providing a clear picture of junction-dependent recombination and voltage loss. In three- and four-junction all-perovskite tandems, junction-selective imaging remains possible despite the increased spectral complexity, enabling spatially resolved analysis of PLQE and QFLS for each layer. These higher-order tandem devices show clear QFLS losses in the wider-bandgap materials compared with their single-junction counterparts, indicating sequential-processing-induced open-circuit voltage losses in the top junctions. This is the first example of PL imaging in all-perovskite tandems beyond two junctions, demonstrating the feasibility of spatially resolving optoelectronic properties in complex multijunction devices. The approach provides a practical route to diagnose voltage and recombination losses layer by layer, accelerating the optimisation of next-generation all-perovskite photovoltaic architectures.